Investigations on anisotropic surface roughness of thin films using X-ray specular reflection topography

✍ Scribed by Shih-Lin Chang; Lisandro P. Cardoso; S. Moehlecke

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 404 KB
• Volume: 73
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(85)90328-8