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Investigations of Surface Forces between Gypsum Microcrystals in Air Using Atomic Force Microscopy

โœ Scribed by Finot, Eric; Lesniewska, Eric; Mutin, Jean-Claude; Goudonnet, Jean-Pierre

Book ID
120367012
Publisher
American Chemical Society
Year
2000
Tongue
English
Weight
308 KB
Volume
16
Category
Article
ISSN
0743-7463

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The origin of contrast in atomic force microscopy (AFM) lies in the probe's response to forces between itself and the sample. These forces most commonly result from changes in height as the tip is scanned over the surface, but can also originate in properties inherent in the sample. These have been