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Investigation of thin film capacitor defects using nematic liquid crystals

✍ Scribed by M. Leščinský; J. Fridrich

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 344 KB
Volume: 14
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(72)90442-7

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