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A study of polycrystalline silicon thin films as a seed layer in liquid phase epitaxy using aluminum-induced crystallization

✍ Scribed by Hyeongnam Kim; Gyuyul Lee; Daewon Kim; Soo-Hong Lee


Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
233 KB
Volume
2
Category
Article
ISSN
1567-1739

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