Investigation of thermally oxidized silicon surfaces using metal-oxide-semiconductor structures

✍ Scribed by Grove, A.S.; Deal, B.E.; Snow, E.H.; Sah, C.T.

• Book ID: 114588790
• Publisher: IEEE
• Year: 1964
• Tongue: English
• Weight: 195 KB
• Volume: 11
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1964.15387