Breakdown field strengths of anodically and thermally grown metal/oxide/semiconductor structures on polycrystalline silicon

✍ Scribed by G. Mende; J. Wende

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 188 KB
• Volume: 142
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(86)90299-3