Investigation of Thermal Stability and Degradation Mechanisms in Ni-Based Ohmic Contacts ton-Type SiC for High-Temperature Gas Sensors

✍ Scribed by Ariel Virshup; Lisa M Porter; Dorothy Lukco; Kristina Buchholt; Lars Hultman; Anita Lloyd Spetz

• Book ID: 107455331
• Publisher: Springer US
• Year: 2009
• Tongue: English
• Weight: 431 KB
• Volume: 38
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-008-0609-y