Improved Thermal Stability Observed in Ni-Based Ohmic Contacts ton-Type SiC for High-Temperature Applications

✍ Scribed by Ariel Virshup; Fang Liu; Dorothy Lukco; Kristina Buchholt; Anita Lloyd Spetz; Lisa M. Porter

• Book ID: 107457106
• Publisher: Springer US
• Year: 2010
• Tongue: English
• Weight: 547 KB
• Volume: 40
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-010-1449-0