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Investigation of the transfer of Cu2+ ions in polyethylene films during thermal oxidation on copper

✍ Scribed by A.I. Kuzavkov; I.L. Ugolev; N.I. Yegorenkov

Book ID
116049885
Publisher
Elsevier Science
Year
1991
Weight
488 KB
Volume
33
Category
Article
ISSN
0032-3950

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The magnitude of the stress in thin oxide lilms on Cu and Fe has been determined using a sensitive stressometer and measuring the relaxation of stress during electrometric reduction of the oxide. The method has the advantage that both the stress and thickness of oxide can be measured simultaneously.