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Investigation of the structure of oxide layers on real GaAs surfaces using X-ray diffuse scattering

✍ Scribed by C. Ghezzi; C. Bocchi; P. Franzosi

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 258 KB
Volume: 121
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(84)90526-1

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