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The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAs

✍ Scribed by L.C. Feldman; J.M. Poate; F. Ermanis; B. Schwartz


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
412 KB
Volume
19
Category
Article
ISSN
0040-6090

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