𝔖 Bobbio Scriptorium

✦ LIBER ✦

Investigation of the Si-SiO2 interface by surface inversion currents : J. Kassabov and D. Dimitrov. Solid-St. Electron.29(4), 477 (1986)

Book ID: 103281262
Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 129 KB
Volume: 27
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(87)90268-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Investigation of the SiSiO2 interface b

Investigation of the SiSiO2 interface by surface inversion currents

✍ J. Kassabov; D. Dimitrov 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 453 KB

Influence of interface charge inhomogene

Influence of interface charge inhomogeneities on the measurement of surface state densities in Si-SiO2 interfaces by means of the MOS a.c. conductance technique : Paul A. Muls, Gilbert J. Declerck and Roger J. van Overstraeten. Solid-St. Electron. 20, 911 (1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 251 KB