Investigation of the molecular processes controlling corrosion failure mechanisms in plastic encapsulated semiconductor devices: R. M. Lum and L. G. Feinstein. Microelectron. Reliab. 21 (1). 15 (1981)

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 92 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(82)90055-5