Investigation of the molecular processes controlling corrosion failure mechanisms in plastic encapsulated semiconductor devices

✍ Scribed by R.M. Lum; L.G. Feinstein

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 649 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90543-6