Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors

✍ Scribed by Baniecki, J. D.; Shioga, T.; Kurihara, K.; Kamehara, N.

• Book ID: 125887346
• Publisher: American Institute of Physics
• Year: 2003
• Tongue: English
• Weight: 474 KB
• Volume: 94
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1620377