✦ LIBER ✦
Impact of time dependent dielectric breakdown and stress-induced leakage current on the reliability of high dielectric constant (Ba,Sr)TiO3 thin-film capacitors for Gbit-scale DRAMs
✍ Scribed by Yamamichi, S.; Yamamichi, A.; Donggun Park; Tsu-Jae King; Chenming Hu
- Book ID
- 114537555
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 223 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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