Investigation of surface passivation of amorphous silicon using photothermal deflection spectroscopy

✍ Scribed by Frye, R. C.; Kumler, J. J.; Wong, C. C.

• Book ID: 121828430
• Publisher: American Institute of Physics
• Year: 1987
• Tongue: English
• Weight: 414 KB
• Volume: 50
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.97866