Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy

✍ Scribed by Gerardin, S.; Bagatin, M.; Paccagnella, A.; Bisello, D.; Giubilato, P.; Mattiazzo, S.; Pantano, D.; Silvestrin, L.; Tessaro, M.; Wyss, J.; Ferlet-Cavrois, V.

• Book ID: 121804013
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 663 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2013.2290012