✦ LIBER ✦
Focussed ion beam and field emission gun–scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells
✍ Scribed by Jonathan D. Major; Leon Bowen; Ken Durose
- Book ID
- 112174734
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 237 KB
- Volume
- 20
- Category
- Article
- ISSN
- 1062-7995
- DOI
- 10.1002/pip.1164
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