𝔖 Bobbio Scriptorium

✦ LIBER ✦

Investigation of Statistical Variation of the Characteristics of SAW Devices Due to Random Fabrication Errors

✍ Scribed by Field, M.E.; Chen, C.L.

Book ID: 114597216
Publisher: Institute of Electrical and Electronics Engineers
Year: 1982
Weight: 689 KB
Volume: 29
Category: Article
ISSN: 0018-9537
DOI: 10.1109/t-su.1982.31301

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