The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 ยฐC. X-ray diffraction (XRD) analysis showed that the structural transformation
โฆ LIBER โฆ
Investigation of physical properties of quaternary AgGa0.5In0.5Te2 thin films deposited by thermal evaporation
โ Scribed by H. Karaagac; M. Parlak
- Book ID
- 116606853
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 564 KB
- Volume
- 503
- Category
- Article
- ISSN
- 0925-8388
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