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Investigation of organic semiconductors by the EPR method

✍ Scribed by L. A. Blyumenfel'd; V. A. Benderskii; L. S. Lyubchenko; I. P. A. Stunzhas


Publisher
SP MAIK Nauka/Interperiodica
Year
1968
Tongue
English
Weight
676 KB
Volume
8
Category
Article
ISSN
0022-4766

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## Abstract A theoretical and experimental analysis of dispersion, polarization, and size resonance frequency of helicon waves in many‐valley semiconductors is made under various assumptions with respect to the structure of the valleys. A new technique to measure carrier concentration, mobility, an