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Investigation of nanometer-scale films using low angle X-ray reflectivity analysis in IPOE

✍ Scribed by Zhan-shan Wang; Yao Xu; Hong-chang Wang; Jing-tao Zhu; Zhong Zhang; Feng-li Wang; Ling-yan Chen

Book ID: 107509396
Publisher: Tianjin University of Technology
Year: 2007
Tongue: English
Weight: 323 KB
Volume: 3
Category: Article
ISSN: 1673-1905
DOI: 10.1007/s11801-007-7016-0

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