๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Investigation of micropipe defect terminating during SiC crystal growth

โœ Scribed by Lin, S. H.; Chen, Z. M.; Liang, P.; Jiang, D.; Xie, H. J.; Yang, Y.; Pan, P.


Book ID
127012642
Publisher
Institute of Materials, Minerals and Mining
Year
2011
Tongue
English
Weight
561 KB
Volume
27
Category
Article
ISSN
0267-0836

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


SR phase contrast imaging to address the
โœ Argunova, Tatiana S. ;Gutkin, Mikhail Yu. ;Je, Jung Ho ;Mokhov, Evgeniy N. ;Naga ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 602 KB

## Abstract Sliced SiC boule grown by physical vapor transport is investigated using synchrotron white beam phase contrast imaging combined with Bragg diffraction. The evolution of defects is revealed. In the early growth stage, foreign polytype inclusions not only induce massive generation of full

Investigation of nitrogen behaviors duri
โœ Xuegong Yu; Deren Yang; Keigo Hoshikawa ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 569 KB

The behaviors of nitrogen during Czochralski (CZ) silicon crystal growth have been investigated in this paper. It is found that the nitrogen impurities in silicon mainly exist as nitrogen pair and nitrogen-oxygen complex. The nitrogen concentration can be exactly determined by Fourier transformed in