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Investigation of LOCOS- and Polysilicon-Bound Diodes for Robust Electrostatic Discharge (ESD) Applications

✍ Scribed by You Li; Liou, J.J.; Vinson, J.E.; Lining Zhang

Book ID: 114619918
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 926 KB
Volume: 57
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2039964

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