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Investigation of ion-bombarded conducting polymer films by scanning electrochemical microscopy (SECM)

✍ Scribed by G. Wittstock; Tim Asmus; Thomas Wilhelm


Book ID
105896046
Publisher
Springer
Year
2000
Tongue
English
Weight
594 KB
Volume
367
Category
Article
ISSN
1618-2650

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The proton concentration-distance profile developed at the interface of silver iodide-based solid-state electrodes in corroding cyanide solutions of low buffer capacity has been studied by scanning electrochemical microscopy using a potentiometric tip. The experimental results verified the theory de