Reactivity at the film/solution interface of ex situ prepared bismuth film electrodes: A scanning electrochemical microscopy (SECM) and atomic force microscopy (AFM) investigation

✍ Scribed by Samo B. Hočevar; Salvatore Daniele; Carlo Bragato; Božidar Ogorevc

• Book ID: 108119094
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 523 KB
• Volume: 53
• Category: Article
• ISSN: 0013-4686
• DOI: 10.1016/j.electacta.2007.07.035