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Investigation of ion-bombarded and annealed Si by UPS and RBS methods

✍ Scribed by G. Peto&#x030B;; T. Lohner; J. Kanski; J. Gyulai

Publisher: Elsevier Science
Year: 1982
Weight: 362 KB
Volume: 199
Category: Article
ISSN: 0167-5087
DOI: 10.1016/0167-5087(82)90251-4

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