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Investigation of ion-beam sputtered Nb-Ti thin films by complementary use of backscattering and nuclear reaction microanalysis

Book ID: 108390178
Publisher: Elsevier Science
Year: 1980
Tongue: English
Weight: 157 KB
Volume: 30
Category: Article
ISSN: 0042-207X
DOI: 10.1016/s0042-207x(80)81068-2

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