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Investigation of interface state density between a-Si:H and insulating layers by ESR and photothermal deflection spectroscopy

โœ Scribed by Ikurou Umezu; Kazuaki Kitamura; Keiji Maeda


Book ID
115991040
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
295 KB
Volume
198-200
Category
Article
ISSN
0022-3093

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