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Characterization of a-Si1-xCx:H/a-Si:H and a-SiNX:H/a-Si:H heterojunctions by photothermal deflection spectroscopy

✍ Scribed by A. Asano; T. Ichimura; M. Ohsawa; H. Sakai; Y. Uchida

No coin nor oath required. For personal study only.

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