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Investigation of Dynamic Memory Effects in Si-dot Devices

✍ Scribed by De Salvo, B. ;Fernandes, A. ;Ghibaudo, G. ;Guillaumot, B. ;Baron, T. ;Reimbold, G.

Book ID: 121383023
Publisher: IEEE
Year: 2000
Weight: 913 KB
Series: undefined series for scimag
Category: Article
DOI: 10.1109/ESSDERC.2000.194769

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