✦ LIBER ✦

Investigation of durability of Cr-p+a-Si:H–V film memory devices

✍ Scribed by J Hu; A.J Snell; J Hajto; M.J Rose; W Edmiston

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Constant current forming in Cr/p+a-Si:H/

✍ J Hu; A.J Snell; J Hajto; A.E Owen 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 118 KB

AC characteristics of Cr/p+a-Si:H/V anal

✍ Hu, J.; Hajto, J.; Snell, A.J.; Rose, M.J. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 166 KB

Critical behavior of the dielectric prop

✍ J. Hu; A.J. Snell; J. Hajto; A.E. Owen; M.J. Rose 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 284 KB

Electronic characterization of new c-Si/

✍ S. Belkouch; E. Gheeraert; A. Deneuville 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 242 KB

Physics of a-Si:H p-i-n devices

✍ R.A. Street 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 703 KB

The passivation of silicon devices by a

✍ Yuliang He 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 271 KB