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Investigation of deformation of surface of Se and Ge films by the method of proton backscattering: V P Alekhin et al, Rep of 5th All-Union Conf of Phys Interact of Charged Part with Single Cryst, Moscow Uaniversity 1974, 386–391 (in Russian)


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
162 KB
Volume
25
Category
Article
ISSN
0042-207X

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