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Investigation of defects in boron implanted silicon by means of p-n junction

✍ Scribed by R Lenhard; S Luby

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 251 KB
Volume: 41
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(90)93803-q

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