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Investigation of composition profiles in thin phosphorus-silicate glass layers

โœ Scribed by Shieshov, Yu. M. ;Nabok, A. V. ;Kopylov, O. N. ;Kropman, D. I.


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
507 KB
Volume
95
Category
Article
ISSN
0031-8965

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