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Investigation of Capillary Forces Using Atomic Force Microscopy

โœ Scribed by Malotky, David L.; Chaudhury, Manoj K.

Book ID
126890633
Publisher
American Chemical Society
Year
2001
Tongue
English
Weight
127 KB
Volume
17
Category
Article
ISSN
0743-7463

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The origin of contrast in atomic force microscopy (AFM) lies in the probe's response to forces between itself and the sample. These forces most commonly result from changes in height as the tip is scanned over the surface, but can also originate in properties inherent in the sample. These have been