Investigation of Backgate-Bias Dependence of Threshold-Voltage Sensitivity to Process and Temperature Variations for Ultra-Thin-Body Hetero-Channel MOSFETs

✍ Scribed by Chang-Hung Yu, ; Pin Su,

• Book ID: 121344030
• Publisher: IEEE
• Year: 2014
• Tongue: English
• Weight: 428 KB
• Volume: 14
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/TDMR.2013.2262115