MATERIALS AND METHODS AFM and zeta potential measurements were applied in order to investigate the influence of adsorption phenomena on the adhesion
A technical, injection molded poly(etheretherketone) behavior of polymer materials. It is shown by means of zeta poten-(PEEK) was investigated, which had been chosen due to tial measurements that hydroxyl anions adsorb much stronger its mechanical and chemical stability. The surface was not than chloride anions onto poly(etheretherketone) surfaces. The damaged by the atomic force microscope (AFM) probe and adhesion forces between the PEEK surface and the silicon nitride did not swell in contact with liquids.
tip of the AFM is lower in potassium hydroxide solution than in XPS measurements showed that the polymer consists of potassium chloride solution corresponding to the different adsorppure poly(etheretherketone) without any dissociable groups tion free energies of the anions. For electrolyte concentrations on the surface. A very small excess of hydrocarbon and above 0.5 mmol/liter no adhesive contact between tip and sample can be established. We propose an explanation based on the action C-O-R groups was found, probably due to hydrocarbon of competitive forces in the system PEEK-electrolyte solutioncontaminants, and a small silicon peak due to silicone and Si 3 N 4 .