Investigation of Abnormal Shifts Under Operating Conditions in Flash Memory Cells With High- Gate Stacks

✍ Scribed by Baojun Tang; Wei Dong Zhang; Jian Fu Zhang; Van den Bosch, G.; Toledano-Luque, M.; Govoreanu, B.; Van Houdt, J.

• Book ID: 114620983
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 432 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2012.2194294