High-Reliability Dynamic-Threshold Source-Side Injection for 2-Bit/Cell With MLC Operation of Wrapped Select-Gate SONOS in nor-Type Flash Memory

✍ Scribed by Kuan-Ti Wang; Tien-Sheng Chao; Woei-Cherng Wu; Wen-Luh Yang; Chien-Hsing Lee; Tsung-Min Hsieh; Jhyy-Cheng Liou; Shen-De Wang; Tzu-Ping Chen; Chien-Hung Chen; Chih-Hung Lin; Hwi-Huang Chen

• Book ID: 114620092
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 522 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2054530