๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Inversion of atom diffraction intensities for surface structural determination

โœ Scribed by D.S. Kaufman; R. James; T. Engel


Publisher
Elsevier Science
Year
1984
Weight
46 KB
Volume
148
Category
Article
ISSN
0167-2584

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Atom-surface potentials by inversion of
โœ A.T. Yinnon; E. Kolodney; A. Amirav; R.B. Gaber ๐Ÿ“‚ Article ๐Ÿ“… 1986 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 466 KB

A direct inversion method is used to transform measured intensities of He diffraction from MgO(1~) over a wide energy range into the part of the interaction potential that depends on surface structure. This provides the first inversion of atom/surface scattering data. Intensities computed from the i

Atomic-scale surface structure determina
โœ Van Hove, Michel A. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 85 KB ๐Ÿ‘ 1 views

This article reviews and speculates on the relative capabilities of major techniques for detailed structure determination of surfaces and interfaces. These techniques are primarily low-energy electron diffraction (LEED), x-ray diffraction (XRD), photoelectron diffraction (PD), x-ray absorption fine