Atomic-scale surface structure determination: comparison of techniques

✍ Scribed by Van Hove, Michel A.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 85 KB
• Volume: 28
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199908)28:1<36::aid-sia614>3.0.co;2-1

✦ Synopsis

This article reviews and speculates on the relative capabilities of major techniques for detailed structure determination of surfaces and interfaces. These techniques are primarily low-energy electron diffraction (LEED), x-ray diffraction (XRD), photoelectron diffraction (PD), x-ray absorption fine structure (XAFS), ion scattering (IS) and scanning tunneling microscopy (STM). Their use for more qualitative structural characterization is also briefly considered. The limits of their applicability to various types of surfaces and interfaces are explored: solid-gas, solid-liquid and solid-solid interfaces; non-crystalline surfaces (quasicrystalline, amorphous, liquid); and magnetic structures and imperfect overlayers on crystalline substrates.