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Interpretation of Infrared Transmittance Spectra of SiO2 Thin Films

✍ Scribed by Kučírková, A.; Navrátil, K.

Book ID
115362298
Publisher
Society for Applied Spectroscopy
Year
1994
Tongue
English
Weight
823 KB
Volume
48
Category
Article
ISSN
0003-7028

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As 20 S 80 thin films with different thicknesses (49.4-763.1 nm) were deposited on glass substrates using a thermal evaporation technique. Spectrophotometric measurements of the films' transmittance were taken in the wavelength range of 190-2500 nm. The transmission spectra were simulated with a com