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Internal stress reduction by incorporation of silicon in diamond-like carbon films

✍ Scribed by Masahito Ban; Takeshi Hasegawa


Book ID
108423123
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
121 KB
Volume
162
Category
Article
ISSN
0257-8972

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Raman spectroscopic and X-ray investigat
✍ R. Krawietz; B. KΓ€mpfe; E. Auerswald; M. BrΓΌcher πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 309 KB πŸ‘ 1 views

## Abstract The non‐destructive characterization of intrinsic stress is very important to evaluate the reliability of devices based on diamond‐like carbon (DLC) films. Whereas the only requirement for the X‐ray diffraction method is a crystalline state of specimen, Raman spectroscopic stress analys