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Internal photoemission — a suitable method for determining band offsets in semiconductor heterostructures

✍ Scribed by G. Abstreiter; U. Prechtel; G. Weimann; W. Schlapp


Book ID
118987070
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
326 KB
Volume
174
Category
Article
ISSN
0039-6028

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