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Internal photoemission transient current temperature spectroscopy — a new method for determination of the gao state distribution in a-Si:H

✍ Scribed by Zi-Min Su; Shao-Qi Peng


Book ID
118333395
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
145 KB
Volume
77-78
Category
Article
ISSN
0022-3093

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