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Internal Electric-Field-Lines Distribution in CdZnTe Detectors Measured Using X-Ray Mapping

✍ Scribed by Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Hossain, A.; Yang, G.; Yao, H. W.; James, R. B.

Book ID: 126709507
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 355 KB
Volume: 56
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2008.2007904

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