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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications - Optical characterization of the internal electric field distribution under bias of CdZnTe radiation detectors

✍ Scribed by Yao, H. Walter; Anderson, Richard J. M.; James, Ralph B.; Hoover, Richard B.; Doty, F. P.

No coin nor oath required. For personal study only.

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