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Interferometry technique for refractive index measurements at subcentimeter wavelengths

✍ Scribed by N. A. Andrushchak; O. I. Syrotynsky; I. D. Karbovnyk; Ya. V. Bobitskii; A. S. Andrushchak; A. V. Kityk

Book ID: 102951950
Publisher: John Wiley and Sons
Year: 2011
Tongue: English
Weight: 605 KB
Volume: 53
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.25944

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✦ Synopsis

Abstract

We demonstrate the interferometry technique for the refractive index measurements at subcentimeter wavelengths. The method is based on a path length sweeping being introduced into one of the interferometer arms, while the sample is tilted out of its normal position with respect to the incident electromagnetic radiation. The determination of the refractive index is realized through the recording of the interference patterns at several tilt angles. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:1193–1196, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.25944

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